Impact of fast and slow transient charging effect on reliability instability in In0.7Ga0.3As quantum-well MOSFETs with high-kappa dielectrics
- Issued Date
- 2020
- Type
- Article
- Publisher
- JAPANESE JOURNAL OF APPLIED PHYSICS
- Language
- 영어
- ISSN
- 0021-4922
- Citation Volume
- 59
- Citation Number
- 11
- Citation Start Page
- 0
- Citation End Page
- 0
- Appears in Collections:
- Engineering > IT Convergence
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