KLI

Impact of fast and slow transient charging effect on reliability instability in In0.7Ga0.3As quantum-well MOSFETs with high-kappa dielectrics

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Publisher
JAPANESE JOURNAL OF APPLIED PHYSICS
Language
영어
ISSN
0021-4922
Citation Volume
59
Citation Number
11
Citation Start Page
0
Citation End Page
0
Appears in Collections:
Engineering > IT Convergence
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