Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate
- Issued Date
- 2020
- Type
- Article
- Publisher
- IEEE ACCESS
- Language
- 영어
- ISSN
- 2169-3536
- Citation Volume
- 8
- Citation Number
- 1
- Citation Start Page
- 211464
- Citation End Page
- 211473
- Appears in Collections:
- Engineering > IT Convergence
- Files in This Item:
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