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Comprehensive Analysis of Quantum Mechanical Effects of Interface Trap and Border Trap Densities of High-k Al2O3/In0.53Ga0.47As on a 300-mm Si Substrate

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Publisher
IEEE ACCESS
Language
영어
ISSN
2169-3536
Citation Volume
8
Citation Number
1
Citation Start Page
211464
Citation End Page
211473
Appears in Collections:
Engineering > IT Convergence
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