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Ulsan Univ. Repository Journal Papers Natural Science Physics

Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation

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Publisher
NPJ 2D MATERIALS AND APPLICATIONS
Language
영어
ISSN
2397-7132
Citation Volume
5
Citation Number
1
Citation Start Page
4
Citation End Page
4
Appears in Collections:
Natural Science > Physics
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