Multiple machine learning approach to characterize two-dimensional nanoelectronic devices via featurization of charge fluctuation
- Issued Date
- 2021
- Type
- Article
- Publisher
- NPJ 2D MATERIALS AND APPLICATIONS
- Language
- 영어
- ISSN
- 2397-7132
- Citation Volume
- 5
- Citation Number
- 1
- Citation Start Page
- 4
- Citation End Page
- 4
- Appears in Collections:
- Natural Science > Physics
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