Data Preprocessing Combination to Improve the Performance of Quality Classification in the Manufacturing Process
- Abstract
- The recent introduction of smart manufacturing, also called the ‘smart factory’, has made it possible to collect a significant number of multi-variate data from Internet of Things devices or sensors. Quality control using these data in the manufacturing process can play a major role in preventing unexpected time and economic losses. However, the extraction of information about the manufacturing process is limited when there are missing values in the data and a data imbalance set. In this study, we improve the quality classification performance by solving the problem of missing values and data imbalances that can occur in the manufacturing process. This study proceeds with data cleansing, data substitution, data scaling, a data balancing model methodology, and evaluation. Five data balancing methods and a generative adversarial network (GAN) were used to proceed with data imbalance processing. The proposed schemes achieved an F1 score that was 0.5 higher than the F1 score of previous studies that used the same data. The data preprocessing combination proposed in this study is intended to be used to solve the problem of missing values and imbalances that occur in the manufacturing process.
- Author(s)
- Eunnuri Cho; Tai-Woo Chang; Gyusun Hwang
- Issued Date
- 2022
- Type
- Article
- Keyword
- class imbalance problem; skewed data; missing data; semiconductor quality data; data classification; machine learning
- DOI
- 10.3390/electronics11030477
- URI
- https://oak.ulsan.ac.kr/handle/2021.oak/15329
- Publisher
- ELECTRONICS
- Language
- 영어
- ISSN
- 2079-9292
- Citation Volume
- 11
- Citation Number
- 3
- Citation Start Page
- 1
- Citation End Page
- 15
-
Appears in Collections:
- Engineering > Engineering
- 공개 및 라이선스
-
- 파일 목록
-
Items in Repository are protected by copyright, with all rights reserved, unless otherwise indicated.