KLI

초고해상도 비젼 검사 시스템의 개발

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Alternative Title
Development of a super high resolution vision inspection system
Abstract
본 연구는 리드 피치가 15mil인 208핀 QFP 칩을 검사하는 초고해상도의 비젼 검사 시스템을 개발하는 것이 목적이다. 이에 다른 새로운 하드웨어화 소프트웨어를 개발하였으며, 칩 리드 검출을 위한 ?燭恝? 알고리즘을 제안하였다. 본 논문에서 제안한 방법은 조명의 간섭에 대한 강한 특성을 가지며 검사 속도 및 정밀도를 향상시켰다.
In this paper, we develop the super high resolution vision inspection system that inspects 208 pin QFP chip type with 15mil lead pich. We suggested a new algorithm of software which detects the lead of chip and designed a hardware system. The suggested method has strong characteristics of light intensity and improved inspection speed and precision.
In this paper, we develop the super high resolution vision inspection system that inspects 208 pin QFP chip type with 15mil lead pich. We suggested a new algorithm of software which detects the lead of chip and designed a hardware system. The suggested method has strong characteristics of light intensity and improved inspection speed and precision.
Author(s)
장홍식김형남조상복
Issued Date
1998
Type
Research Laboratory
URI
https://oak.ulsan.ac.kr/handle/2021.oak/3979
http://ulsan.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000002024868
Alternative Author(s)
Jang, Hong SikKim, Hyung NamChe, Sang Bock
Publisher
공학연구논문집
Language
kor
Rights
울산대학교 저작물은 저작권에 의해 보호받습니다.
Citation Volume
29
Citation Number
2
Citation Start Page
707
Citation End Page
717
Appears in Collections:
Research Laboratory > Engineering Research
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