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Template Engineering of Metal-to-Insulator Transitions in Epitaxial Bilayer Nickelate Thin Films

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Alternative Title
Template Engineering of Metal-to-Insulator Transitions in Epitaxial Bilayer Nickelate Thin Films
Abstract
Understanding metal-to-insulator phase transitions in solids has been a keystone not only for discovering novel
physical phenomena in condensed matter physics but also for achieving scientific breakthroughs in materials science. In this
work, we demonstrate that the transport properties (i.e., resistivity and transition temperature) in the metal-to-insulator transitions of
perovskite nickelates are tunable via the epitaxial heterojunctions of LaNiO3 and NdNiO3 thin films. A mismatch in the oxygen
coordination environment and interfacial octahedral coupling at the oxide heterointerface allows us to realize an exotic phase that is
unattainable in the parent compound. With oxygen vacancy formation for strain accommodation, the topmost LaNiO3 layer
in LaNiO3/NdNiO3 bilayer thin films is structurally engineered and it electrically undergoes a metal-to-insulator transition that does not appear in metallic LaNiO3. Modification of the NdNiO3 template layer thickness provides an additional knob for tailoring the tilting angles of corner-connected NiO6 octahedra and the linked transport characteristics further. Our approaches can be harnessed to tune physical properties in complex oxides and to realize exotic physical phenomena through oxide thin-film heterostructuring.
Author(s)
이종민김기엽정세엽양미현김종우조병관최영성김상모최진산이태권김지웅이동렬장서형박성균정종훈박정웅구태영Philip J. Ryan임규욱김상훈최시영김태헌이상한
Issued Date
2021
Type
Article
Keyword
metal-to-insulator phase transitiontemplate engineeringoxidethin filmheteroepitaxy
DOI
10.1021/acsami.1c13675
URI
https://oak.ulsan.ac.kr/handle/2021.oak/9537
https://ulsan-primo.hosted.exlibrisgroup.com/primo-explore/fulldisplay?docid=TN_cdi_proquest_miscellaneous_2594292304&context=PC&vid=ULSAN&lang=ko_KR&search_scope=default_scope&adaptor=primo_central_multiple_fe&tab=default_tab&query=any,contains,Template%20Engineering%20of%20Metal-to-Insulator%20Transitions%20in%20Epitaxial%20Bilayer%20Nickelate%20Thin%20Films&offset=0&pcAvailability=true
Publisher
ACS Applied Materials & Interfaces
Location
미국
Language
영어
ISSN
1944-8244
Citation Volume
13
Citation Number
45
Citation Start Page
54466
Citation End Page
54475
Appears in Collections:
Natural Science > Physics
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