전반사형 박막계를 이용한 레이저 광파 편극의 변조

Abstract

위상변위차를 보정하고 편극상태를 유지시키는 박막계를 설계하였다. 막스웰 방정식으로 부터 유더된 박막이론을 이용하여, 전반사에 대한 admittance를 유도하고 편국상태와 관계되는 반사계수들의 비에 대해 논의했다. 이 결과로부터 He-Ne레이저 파장에 대해, 고반사를 주면서 위상변위차를 보전하는 전반사형 박막계로, 유리(n?=1.80)-MgF₂ 공기박막계(유전체 한층 박막계)와 유리(n??=1.52)-ZnS-MgF₂ 공기계를 설계했다.

We designed the optical thin film systems correcting the differential phase shift and pressrving the state of polarization.

We used the thin film matrix representation derived from Maxwell equations. And we derived the complex admittances, which is the generalized refractive indices. for total internal reflection. The ratio of the paralld and perpendicular components of the electric field. which is related to the state of polarization, is discussed From these results, total reflection in thin film system is useful in correcting differential phase shift and giving high reflectance. Glass(n?=1.80)-MgF₂-system (case of one dielectric film) and glass (n?=1.52)-ZnS-MgF₂-air system (case of two dielectric films) are designed in order to preserve polarization at the wavelength of the He-Ne laser beam.

We designed the optical thin film systems correcting the differential phase shift and pressrving the state of polarization.

We used the thin film matrix representation derived from Maxwell equations. And we derived the complex admittances, which is the generalized refractive indices. for total internal reflection. The ratio of the paralld and perpendicular components of the electric field. which is related to the state of polarization, is discussed From these results, total reflection in thin film system is useful in correcting differential phase shift and giving high reflectance. Glass(n?=1.80)-MgF₂-system (case of one dielectric film) and glass (n?=1.52)-ZnS-MgF₂-air system (case of two dielectric films) are designed in order to preserve polarization at the wavelength of the He-Ne laser beam.